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UNI-T UTS3036B Series Spectrum Analyzers
UNI-T UTS3036B Series Spectrum Analyzers
₨747,500
The UTS3000B series spectrum analyzer can measure frequencies up to 8.4GHz. It is a spectrum analyzer with wide frequency band coverage and superior performance. The series adopts mature all digital IF technology. It provides a variety of analysis functions, and up to 40001 scanning points , providing better help for your frequency domain analysis. This series of spectrum adopts a 10.1 inch large touch screen, which will bring you a better use experience. The UTS3000B series can be applied to functional/terminal/quality inspection tests in the electronics manufacturing industry, as well as wireless communication measurement, RF microwave courses, electromagnetic compatibility pre-scan, semiconductor measurement and many other application scenarios.
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UNI-T UTS3036B Series Spectrum Analyzers
Multi touch HD screen for quick operation
10.1-inch multi-touch HD capacitive screen. Quick menu settings. Supports multiple gesture operations such as dragging, expanding, and zooming on the trace. Convenient human-computer interaction operation solves the problem of cumbersome and difficult operation to the greatest extent.
Excellent sensitivity to test weaker signals
The weak signal test is easily affected by the noise floor of the spectrum analyzer itself. UTS3000B series DANL as low as -161dBm, excellent sensitivity can effectively test weak signals.
Removable dust mesh
With a detachable dust filter, after the instrument is used for a period of time, the user can remove the dust from the air inlet. To ensure the reliability of the whole machine, it can avoid short-circuit, burn or fire caused by dust.
Scan 40001 points
The UTS3000B series provides up to 40,001 sweep points, providing higher frequency resolution, making it easier to capture signals that are difficult to detect.
Excellent selectivity
It has stronger signal resolution capability of adjacent unequal amplitudes.
EMI pre-compliance
UTS3000B series Optional components, together with near-field probes, help you find and improve EMI defects in advance. Thereby shortening the development cycle
